Deflection efficiency of self-transducing, self-sensing cantilevers suitable for fast-AFM, scanning probe lithography and array operation

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dc.contributor.authorRangelow, I.W.
dc.contributor.authorIvanov, T.
dc.contributor.authorHofer, M.
dc.contributor.authorAngelov, T.
dc.contributor.authorHolz, M.
dc.contributor.authorLenk, S.
dc.contributor.authorAtanasov, I.
dc.contributor.authorKaestener, M.
dc.contributor.authorGuliyev, E.
dc.contributor.authorRoeser, D.
dc.contributor.authorGutschmidt, S.
dc.contributor.authorSattel, S.
dc.contributor.authorAhmad, A.
dc.date.accessioned2015-09-15T02:41:30Z
dc.date.available2015-09-15T02:41:30Z
dc.date.issued2015en
dc.identifier.citationRangelow, I.W., Ivanov, T., Hofer, M., Angelov, T., Ahmad, A., Holz, M., Lenk, S., Atanasov, I., Kaestener, M., Guliyev, E., Roeser, D., Gutschmidt, S., Sattel, S. (2015) Deflection efficiency of self-transducing, self-sensing cantilevers suitable for fast-AFM, scanning probe lithography and array operation. Auckland, New Zealand: 12th International Workshop on Nanomechanical Sensing (NMC 2015), 13-15 Jul 2015.en
dc.identifier.urihttp://hdl.handle.net/10092/10892
dc.language.isoen
dc.publisherUniversity of Canterbury. Mechanical Engineeringen
dc.rights.urihttps://hdl.handle.net/10092/17651en
dc.subject.anzsrcField of Research::10 - Technology::1007 - Nanotechnologyen
dc.titleDeflection efficiency of self-transducing, self-sensing cantilevers suitable for fast-AFM, scanning probe lithography and array operationen
dc.typeConference Contributions - Other
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