Measurement of surface plasmon resonance intensity in thin film plasmonic sensors

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dc.contributor.authorMoore C
dc.contributor.authorWarren A
dc.contributor.authorBabu R
dc.contributor.authorSwan S
dc.contributor.authorGouws G
dc.date.accessioned2020-11-30T00:44:02Z
dc.date.available2020-11-30T00:44:02Z
dc.date.issued2019en
dc.date.updated2020-11-09T23:34:44Z
dc.identifier.citationMoore C, Warren A, Babu R, Swan S, Gouws G (2019). Measurement of surface plasmon resonance intensity in thin film plasmonic sensors. Wellington: 9th International Conference on Advanced Materials and Nanotechnology. 10/02/2019-14/02/2019.en
dc.identifier.urihttps://hdl.handle.net/10092/101303
dc.language.isoen
dc.rightsAll rights reserved unless otherwise stateden
dc.rights.urihttp://hdl.handle.net/10092/17651en
dc.subject.anzsrcFields of Research::40 - Engineering::4009 - Electronics, sensors and digital hardware::400909 - Photonic and electro-optical devices, sensors and systems (excl. communications)en
dc.titleMeasurement of surface plasmon resonance intensity in thin film plasmonic sensorsen
dc.typeConference Contributions - Otheren
uc.collegeFaculty of Engineering
uc.departmentElectrical and Computer Engineering
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