Highly correlated model-based testing of insulin sensitivity – initial results for a proposed low-intensity test
Type of content
Conference Contributions - Other
UC permalink
Publisher's DOI/URI
Thesis discipline
Degree name
Publisher
University of Canterbury. Mechanical Engineering.
Journal Title
Journal ISSN
Volume Title
Language
Date
2006
Authors
Lotz, T.
Chase, Geoff
McAuley, K.A.
Shaw, Geoff
Wong, X-W.
Lin, J.
LeCompte, A.
Hann, C.E.
Mann, J.I.
Abstract
Description
Citation
Lotz, T., Chase, J.G., McAuley, K.A., Shaw, G.M., Wong, X.W., Lin, J., LeCompte, A., Hann, C.E., Mann, J.I. (2006) Highly correlated model-based testing of insulin sensitivity – initial results for a proposed low-intensity test. Atlanta, GA, USA: 6th Annual Diabetes Technology Meeting of the Diabetes Technology Society, 2-4 Nov 2006.
Keywords
Insulin sensitivity