Moore, CiaranArnold, M.D.Bones, P.J.Blaikie, R.J.2010-01-132010-01-132008Moore, C.P., Arnold, M.D, Bones, P.J., Blaikie, R.J. (2008) Analysis and Comparison of Simulation Techniques for Silver Superlenses. Melbourne, Australia: 2008 International Conference on Nanoscience and Nanotechnology (ICONN08), 25-29 Feb 2008.http://hdl.handle.net/10092/3381210-213Transfer-matrix and finite element modelling techniques were used to simulate single- and multi-layer silver-based superlenses. The techniques were compared for their abilities to simulate sub-diffraction-limited resolution and DC transmission. The finite element modelling technique confirmed conclusions drawn from T-matrix analysis, namely that multi-layer superlenses had greater transmission over a larger window of spatial frequencies than single-layer superlenses and that superlens performance was adversely affected by resonances at different frequencies. The failure of the T-matrix technique to model interactions between the mask and lens was identified as one of the main sources of inaccuracy; however, the technique remained valuable due to its superior computational efficiency compared to finite element modelling.en"©2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."superlensnear-field imagingsimulation toolsConference Contributions - PublishedFields of Research::290000 Engineering and Technology::290900 Electrical and Electronic Engineering::290903 Other electronic engineeringFields of Research::240000 Physical Sciences::240400 Optical Physics::240401 Optics and opto-electronic physicshttps://doi.org/10.1109/ICONN.2008.4639284