Lotz, T.Chase, GeoffMcAuley, K.A.Shaw, GeoffWong, X-.W,LeCompte, A.Lin, J.2008-10-292008-10-292007Lotz, T., Chase, J.G., McAuley, K.A., Shaw, G.M., Wong, X-.W, Lin, J., LeCompte, A. (2007) Highly correlated model-based testing of insulin sensitivity - initial results for a proposed low-intensity test. Journal of Diabetes Science and Technology, 1(2), pp. A103.http://hdl.handle.net/10092/1743Insulin resistance (IR) is a major risk factor in the pathogenesis of type 2 Diabetes and cardiovascular disease. A simple, high resolution assessment of IR would enable earlier diagnosis and more frequent monitoring of intervention effects. Current assessments are either too intensive for clinical settings (Euglycemic Clamp, IVGTT) or have too low resolution (HOMA).enJournal ArticleFields of Research::290000 Engineering and Technology::291500 Biomedical EngineeringFields of Research::320000 Medical and Health Sciences::321000 Clinical Sciences::321004 Endocrinology