Surface texturing for silcon solar cells using reactive ion etching technique

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Conference Contributions - Published
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University of Canterbury. Electrical and Computer Engineering
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Date
2002
Authors
Kumaravelu, G.
Alkaisi, M.M.
Bittar, A.
Abstract

Surface texturing is an effective and more lasting technique in reducing reflections and improving light trapping compared to antireflection coatings. A surface texturing technique using Reactive Ion Etching (RIE) method suitable for crystalline and multi crystalline solar cells, which resulted in surfaces with negligible reflection in the visible band is described. Different texturing structures (pillars, holes and black silicon) have been studied and compared in the wavelength range from 250nm-2500nm. It is found that the reflectance of the textured column structures were less than 0.4% at wavelengths from 500nm to 1000nm and showed a minimum of 0.29% at 1000 nm while the reflectivity from black silicon is around 1% and hole structures is around 6.8% in the same wavelength range.

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Citation
Kumaravelu, G., Alkaisi, M.M., Bittar, A. (2002) Surface texturing for silcon solar cells using reactive ion etching technique. New Orleans, LA, USA: Photovoltaic Specialists Conference 2002, 19-24 May 2002. Conference Record of the 29th IEEE Photovoltaic Specialists Conference, 258-261.
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