Analysis and Comparison of Simulation Techniques for Silver Superlenses (2008)
Type of ContentConference Contributions - Published
PublisherUniversity of Canterbury. Electrical and Computer Engineering
AuthorsMoore, C.P., Arnold, M.D., Bones, P.J., Blaikie, R.J.show all
Transfer-matrix and finite element modelling techniques were used to simulate single- and multi-layer silver-based superlenses. The techniques were compared for their abilities to simulate sub-diffraction-limited resolution and DC transmission. The finite element modelling technique confirmed conclusions drawn from T-matrix analysis, namely that multi-layer superlenses had greater transmission over a larger window of spatial frequencies than single-layer superlenses and that superlens performance was adversely affected by resonances at different frequencies. The failure of the T-matrix technique to model interactions between the mask and lens was identified as one of the main sources of inaccuracy; however, the technique remained valuable due to its superior computational efficiency compared to finite element modelling.
CitationMoore, C.P., Arnold, M.D, Bones, P.J., Blaikie, R.J. (2008) Analysis and Comparison of Simulation Techniques for Silver Superlenses. Melbourne, Australia: 2008 International Conference on Nanoscience and Nanotechnology (ICONN08), 25-29 Feb 2008.
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