Highly correlated model-based testing of insulin sensitivity - initial results for a proposed low-intensity test
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Journal Article
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University of Canterbury. Mechanical Engineering.
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2007
Authors
Lotz, T.
Chase, Geoff
McAuley, K.A.
Shaw, Geoff
Wong, X-.W,
LeCompte, A.
Lin, J.
Abstract
Insulin resistance (IR) is a major risk factor in the pathogenesis of type 2 Diabetes and cardiovascular disease. A simple, high resolution assessment of IR would enable earlier diagnosis and more frequent monitoring of intervention effects. Current assessments are either too intensive for clinical settings (Euglycemic Clamp, IVGTT) or have too low resolution (HOMA).
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Lotz, T., Chase, J.G., McAuley, K.A., Shaw, G.M., Wong, X-.W, Lin, J., LeCompte, A. (2007) Highly correlated model-based testing of insulin sensitivity - initial results for a proposed low-intensity test. Journal of Diabetes Science and Technology, 1(2), pp. A103.