Modelling the temperature dependent reverse recovery behaviour of power diodes
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Conference Contributions - Other
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Publisher
University of Canterbury. Electrical and Computer Engineering.
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Date
2000
Authors
Reid, M.D.
Round, S.
Duke, R.
Abstract
A power diode PSpice model is presented for cryogenic use. This model can accurately simulate the diodes reverse recovery behaviour over all temperatures from 77K to room temperature. It has been tested over the full range of temperatures and the match with experimental data is excellent.
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Citation
Reid, M.D., Round, S. and Duke, R. (2000) Modelling the temperature dependent reverse recovery behaviour of power diodes. Tokyo, Japan: International Power Electronics Conference, 2000. 779--783.