XIDENT : a computer technique for the direct indexing of electron diffraction spot patterns
A rapid computer technique to index electron diffraction spot patterns from any crystal structure is described. The diffracting zone, which is represented to the computer by the measured diffracted distances of three or five diffraction spots and the angles between them, is compared with the reciprocal lattices of phases likely to be present, and all zones which correspond within prescribed limits are printed out in order of best fit. The program provides for automatic rejection of prohibited reflections for the Bravais lattices, and for the suppression of symmetrical solutions if desired. The technique is of general application, but has proved particularly useful for the indexing of patterns from unidentified non-cubic structures in situations where experimental error must be tolerated.
SubjectsField of Research::08 - Information and Computing Sciences::0803 - Computer Software
- Engineering: Reports